ADR443 Datasheet

• Ultralow noise (0.1 Hz to 10 Hz)
  • ADR443: 1.4 μV p-p
• Superb temperature coefficient
  • A Grade: 10 ppm/°C
  • B Grade: 3 ppm/°C
• Low dropout operation (supply voltage headroom): 500 mV
• Input range: (V_OUT + 500 mV) to 18 V
• High output source and sink current
  • +10 mA and −5 mA, respectively
• Wide temperature range: −40°C to +125°C

• Precision data acquisition systems
• High resolution data converters
• Battery-powered instrumentation
• Portable medical instruments
• Industrial process control systems
• Precision instruments
• Optical control circuits

The ADR443s is a family of XFET^® voltage references featuring ultralow noise, high accuracy, and low temperature drift performance. Using Analog Devices, Inc., patented temperature drift curvature correction and XFET (eXtra implanted junction FET) technology, voltage change vs. temperature nonlinearity in the ADR443 is greatly minimized.

The XFET references offer better noise performance than buried Zener references, and XFET references operate off low supply voltage headroom (500 mV). This combination of features makes the ADR443 ideally suited for precision signal conversion applications in high-end data acquisition systems, optical networks, and medical applications.

The ADR443 has the capability to source up to 10 mA of output current and sink up to −5 mA. It also comes with a trim terminal to adjust the output voltage over a 0.5% range without compromising performance.

The ADR443 is available in 8-lead MSOP and narrow SOIC packages and offered in two electrical grades. All versions are specified over the extended industrial temperature range of −40°C to +125°C.